• Thumbnail for Electromigration
    Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting...
    36 KB (4,574 words) - 05:50, 12 August 2024
  • total flux is composed of three elements: diffusion, advection, and electromigration. This implies that the concentration is affected by an ionic concentration...
    5 KB (697 words) - 21:48, 24 May 2023
  • respectively, qualifying it as a good alternative to copper. Resistance to electromigration, the process by which a metal conductor changes shape under the influence...
    11 KB (1,568 words) - 20:08, 25 August 2024
  • Thumbnail for Failure of electronic components
    heating and circuit failure. Soldered joints can fail in many ways like electromigration and formation of brittle intermetallic layers. Some failures show only...
    40 KB (4,991 words) - 12:02, 19 August 2024
  • Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage...
    2 KB (221 words) - 01:03, 21 June 2024
  • the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase...
    2 KB (279 words) - 14:44, 29 June 2024
  • main causes of transistor aging in MOSFETs are electromigration and charge trapping. Electromigration is the movement of ions caused by momentum from...
    3 KB (362 words) - 05:13, 31 July 2024
  • they work (blow) by electromigration, the phenomenon that electric flow causes the conductor material to move. Although electromigration is generally undesired...
    7 KB (681 words) - 12:52, 16 July 2024
  • Thumbnail for List of LED failure modes
    gallium nitride are virtually insensitive to this kind of defect. Electromigration: This is caused by high current density and can move atoms out of the...
    5 KB (614 words) - 18:39, 9 February 2024
  • Thumbnail for Current density
    material forming the interconnections actually moves, a phenomenon called electromigration. In superconductors excessive current density may generate a strong...
    23 KB (2,812 words) - 02:59, 27 May 2024