File:AFMsetup.jpg - 维基百科,自由的百科全书
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日期/时间 | 缩略图 | 大小 | 用户 | 备注 | |
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当前 | 2006年11月21日 (二) 14:10 | ![]() | 721 × 569(86 KB) | KristianMolhave | *Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made |
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